Scientists have captured the world’s first ever X-ray of a single atom in remarkable discovery


For decades, X-rays have been a cornerstone of medical diagnosis and security screenings, revealing the inner workings of our bodies and luggage. But the ability to image individual atoms has remained elusive, limiting our understanding of the fundamental building blocks of matter. Now, a groundbreaking achievement by a team led by Professor Saw Wai Hla of Ohio University and Argonne National Laboratory has shattered this barrier.

The Challenge: Unveiling the Secrets of Single Atoms

Previously, the smallest amount of material that X-rays could detect hovered around 10,000 atoms. This limitation meant scientists lacked a crucial tool to directly analyze the composition and properties of individual atoms. As Professor Hla explains, without the ability to see the “fingerprint” of a single atom through X-rays, it’s impossible to definitively determine its makeup and chemical behavior.

A New Dawn: Imaging Atoms with Unprecedented Detail

The research team, funded by the US Department of Energy, embarked on a mission to push the boundaries of X-ray technology. Their goal: to capture an X-ray image of a single atom. This seemingly insurmountable task required a novel approach.

The Winning Formula: Synchrotron X-rays and Specialized Detectors

The key to success lay in a powerful instrument known as a synchrotron X-ray source. This specialized device generates highly focused beams of X-rays, perfect for probing the minute details of individual atoms. The team, working at Argonne National Laboratory’s Center for Nanoscale Materials, used this powerful tool to study single iron and terbium atoms.

However, the synchrotron X-ray source alone wasn’t enough. To isolate and amplify the faint X-ray signal from a single atom, the researchers employed a special detector. This detector, meticulously crafted with a sharp metal tip positioned near the atom, efficiently collected the X-ray excited electrons emitted by the lone atom.

SX-STM: A Technique for the Future of Nanoscale Science

This innovative technique, dubbed synchrotron X-ray scanning tunneling microscopy (SX-STM), represents a significant leap forward in X-ray science and nanoscale studies, according to the study’s lead author, Tolilope Michael Ajayi. Using SX-STM, the team achieved their ambitious goal – not only capturing a distinct X-ray signature from a single atom but also revealing its chemical state. The experiment revealed that the terbium atom remained relatively isolated and unchanged, while the iron atom exhibited a strong interaction with its surroundings.

Unveiling a World of Possibilities

The team’s groundbreaking research, published in the prestigious journal Nature under the title “Characterization of just one atom using synchrotron rays,” paves the way for a new era of X-ray experimentation. As the study emphasizes, SX-STM merges the power of synchrotron X-rays with the precision of quantum tunneling, opening doors for the simultaneous analysis of elemental and chemical properties of materials at the single-atom level.

Professor Hla’s vision for the future is nothing short of transformative. He believes that by deconstructing materials down to the level of individual atoms, scientists can unlock breakthroughs in environmental and medical science, potentially leading to life-saving discoveries. This groundbreaking achievement in X-ray technology marks a giant leap forward in our understanding of the fundamental building blocks of our universe, with the potential to revolutionize countless fields for the betterment of humankind.


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